In situ characterization technique for nanotribological investigations

Share/Save/Bookmark

Deladi, S. and Berenschot, J.W. and Boer de, M.J. and Krijnen, G.J.M. and Tas, N.R. and Elwenspoek, M.C. (2005) In situ characterization technique for nanotribological investigations. Review of Scientific Instruments, 76 (1). 016102. ISSN 0034-6748

[img]
Preview
PDF
287Kb
Abstract:An innovative technique has been developed to enable in situ monitoring of mechanical surface modification. The method is based on using a test surface and a sharp tip located on two different cantilevers; one for mechanical surface modification and the other for in situ detection of surface topography change. The device can be used in standard atomic force microscope, the image obtained during scanning contains information about a partly modified and a partly unmodified topography for each scanning line, thus quantification of surface topography modification (e.g., wear) or the change of different parameters (e.g., friction force) can be followed as it occurs. The characterization technique and typical results are presented.
Item Type:Article
Copyright:© 2006 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/54365
Official URL:http://dx.doi.org/10.1063/1.1834712
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 228457