Critical current degradation in HTS wires due to cyclic mechanical strain

Ryan, David T. and Li, Liang and Huang, Xianrui and Bray, J.W. and Laskaris, Evangelos T. and Sivasubramaniam, Kiruba and Gadre, Aniruddha D. and Fogerty, James M. and Harley, E.J. and Otto, A. and Ouden den, A. (2005) Critical current degradation in HTS wires due to cyclic mechanical strain. IEEE Transactions on Applied Superconductivity, 15 (2). pp. 3684-3687. ISSN 1051-8223

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Abstract:	HTS wires, which may be used in many devices such as magnets and rotating machines, may be subjected to mechanical strains from electromagnetic, thermal and centripetal forces. In some applications these strains will be repeated several thousand times during the lifetime of the device. We have measured critical current degradation due to repeated strain cycles for both compressive and tensile strains. Results for BSCCO-2223 HTS conductor samples are presented for strain values up to 0.5% and cycle numbers up to and beyond 10/sup 4/.
Item Type:	Article
Copyright:	© 2005 IEEE
Research Group:	Low Temperatures - Biomagnetism (LT)
Link to this item:	http://purl.utwente.nl/publications/54007
Official URL:	http://dx.doi.org/10.1109/TASC.2005.849392
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Metis ID: 227464