Finite element and perturbative study of buffered leaky planar waveguides

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Uranus, H.P. and Hoekstra, H.J.W.M. and Groesen van, E. (2005) Finite element and perturbative study of buffered leaky planar waveguides. Optics Communications, 253 (1-3). pp. 99-108. ISSN 0030-4018

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Abstract:The effects of the presence of a high-index medium in the proximity of planar waveguiding structures that makes up buffered leaky waveguides, were studied using a finite element method (FEM) leaky mode solver and a perturbation method. Various phenomena observed in the FEM results were interpreted through the approximate analytical expressions derived using the perturbation method. The effect of the buffer layer thickness, the high-index medium refractive index, and the quasi-confinement of the modal field were investigated. The results show that the perturbation due to the high-index medium can lead to either an increase or a decrease of the real part of the effective index, and that the leakage loss of a TE-polarized mode is not always lower than TM-polarized mode of the same order. It was found that if the refractive index of the high-index medium goes to infinity, a leaky-wave structure evolves into a guided-wave structure.
Item Type:Article
Copyright:© 2005 Elsevier B.V.
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/52717
Official URL:http://dx.doi.org/10.1016/j.optcom.2005.04.053
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Metis ID: 224426