Faceting of
steps on Si(001) and Ge(001) surfaces
Zandvliet, H.J.W. and Gurlu, O. and Gastel van, R. and Poelsema, B. (2004) Faceting of steps on Si(001) and Ge(001) surfaces. Physical Review B: Condensed matter and materials physics, 69 (12). p. 125311. ISSN 1098-0121
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| Abstract: | We have used scanning tunneling microscopy to study the faceting of <010> oriented steps on Si(001) and Ge(001) surfaces. The <010> oriented steps on Si(001) tend to facet into local SA and SB step segments, whereas <010> oriented steps on Ge(001) meander along the mean <010> direction. We show that the step faceting behavior of the Si and Ge(001) surfaces is fully governed by the next-nearest-neighbor (NNN) interaction between the substrate dimers. Only in the case of a repulsive NNN interaction, as for Si(001), faceting occurs. |
| Item Type: | Article |
| Copyright: | © 2004 The American Physical Society |
| Faculty: | Science and Technology (TNW) |
| Research Group: | |
| Link to this item: | http://purl.utwente.nl/publications/48890 |
| Official URL: | http://dx.doi.org/10.1103/PhysRevB.69.125311 |
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