Mott Schottky measurements as a probe for site-binding dynamics at electrolyte | thin-insulator | silicon structures


Share/Save/Bookmark

Faber, E.J. and Groeneveld, W.H. and Olthuis, W. and Berg van den, A. (2004) Mott Schottky measurements as a probe for site-binding dynamics at electrolyte | thin-insulator | silicon structures. In: The Sense of Contact 2004: where Industry meets Science, workshop Sensortechnology, March 23, 2004, Wageningen, Netherlands.

Full text not available from this repository. The author is invited to upload the full text of this publication.

Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/48373
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 219781