Mott Schottky measurements as a probe for site-binding dynamics at electrolyte | thin-insulator | silicon structures
Faber, E.J. and Groeneveld, W.H. and Olthuis, W. and Berg van den, A. (2004) Mott Schottky measurements as a probe for site-binding dynamics at electrolyte | thin-insulator | silicon structures. In: The Sense of Contact 2004: where Industry meets Science, workshop Sensortechnology, March 23, 2004, Wageningen, Netherlands.
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|Item Type:||Conference or Workshop Item|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/48373|
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