Influence of substrate-film interface engineering on the superconducting properties of YBa2Cu3O7-d

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Rijnders, Guus and Curras, Steve and Huijben, Mark and Blank, Dave H.A. and Rogalla, Horst (2004) Influence of substrate-film interface engineering on the superconducting properties of YBa2Cu3O7-d. Applied Physics Letters, 84 (7). pp. 1150-1152. ISSN 0003-6951

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Abstract:The atomic stacking sequence at the substrate-film interface plays an essential role in the heteroepitaxial growth of REBa2Cu3O7-d. During initial growth, the interface configuration influences the surface morphology and structural properties of the film, due to the formation of anti-phase boundaries (APBs) by coalescence of islands with different stacking sequences. In this study, the interface configuration is accurately controlled by both the terminating atomic layer of the SrTiO3 substrate and the stoichiometry of the first unit cell layer. Using this capability the network of APBs and, therefore, the in-plane ordering is tuned, allowing the study of its influence on the structural and electrical properties of the YBa2Cu3O7-d film. The critical temperature Tc is depressed by increase of the in-plane ordering, which strongly indicates that the presence of APBs in the sample favors the oxygen in-diffusion.
Item Type:Article
Copyright:© 2004 American Institute of Physics
Faculty:
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/47719
Official URL:http://dx.doi.org/10.1063/1.1646463
Publisher URL:http://link.aip.org/link/?APPLAB/84/1150/1
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