Plasma-Charging Damage of Floating MIM Capacitors

Wang, Zhichun and Ackaert, Jan and Salm, Cora and Kuper, Fred G. and Tack, Marnix and De Backer, Eddy and Coppens, Peter and De Schepper, Luc and Vlachakis, Basil (2004) Plasma-Charging Damage of Floating MIM Capacitors. IEEE Transactions on Electron Devices, 51 (6). pp. 1017-1024. ISSN 0018-9383

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Abstract:	In this paper, the mechanism of plasma-charging damage (PCD) of metal-insulator-metal (MIM) capacitors as well as possible protection schemes are discussed. A range of test structures with different antennas simulating interconnect layout variations have been used to investigate the mechanism of PCD of MIM capacitors. Based on the experimental results, two models are presented, describing the relation between the damage and the ratio of the area of the exposed antennas connected to the MIM capacitors plates. New design rules are proposed in order to predict and automatically flag possible PCD sites. Furthermore, layout solutions to reduce PCD are suggested.
Item Type:	Article
Copyright:	©2004 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Semiconductor Components (SC)
Link to this item:	http://purl.utwente.nl/publications/47482
Official URL:	http://dx.doi.org/10.1109/TED.2004.829518
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