NiAl seed layer for obliquely sputtered thin film tape

Nguyen, L.T. and Hozoi, A. and Lodder, J.C. (2004) NiAl seed layer for obliquely sputtered thin film tape. IEEE Transactions on Magnetics, 40 (4). pp. 2401-2403. ISSN 0018-9464

PDF
Restricted to UT campus only: Request a copy
118Kb

Abstract:	Two types of magnetic tape were produced by oblique sputtering with the incident angle of 65/spl plusmn/5/spl deg/. One consists of a 180-nm Cr underlayer layer and 20-nm Co layer. The other consists of a 90-nm NiAl seed layer, 90-nm Cr intermediate layer, and 20-nm Co layer. It is shown that the use of NiAl seed layer allows further reduction of the Co grain size and improves the film smoothness. The fine microstructure obtained in the NiAl seed layer resulted in smaller Co grains with more uniform size distribution. This caused the switching field distribution to become narrower, while the values of the squareness and coercivity remained high. The recording performances were also improved for the tape with NiAl seed layer.
Item Type:	Article
Copyright:	© 2004 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Link to this item:	http://purl.utwente.nl/publications/47379
Official URL:	http://dx.doi.org/10.1109/TMAG.2004.829816
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 217782