Towards Structural Testing of Superconductor Electronics


Share/Save/Bookmark

Joseph, Arun A. and Kerkhoff, Hans G. (2003) Towards Structural Testing of Superconductor Electronics. In: International Test Conference, ITC 2003, Sept. 30 - Oct. 2, 2003, Baltimore, USA (pp. pp. 1182-1191).

open access
[img]
Preview
PDF
1MB
Abstract:Many of the semiconductor technologies are already
facing limitations while new-generation data and
telecommunication systems are implemented. Although in
its infancy, superconductor electronics (SCE) is capable of
handling some of these high-end tasks. We have started a
defect-oriented test methodology for SCE, so that reliable
systems can be implemented in this technology. In this
paper, the details of the study on the Rapid Single-Flux
Quantum (RSFQ) process are presented. We present
common defects in the SCE processes and corresponding
test methodologies to detect them. The (measurement)
results prove that we are able to detect possible random
defects for statistical purposes in yield analysis. This
paper also presents possible test methodologies for RSFQ
circuits based on defect oriented testing (DOT).
Item Type:Conference or Workshop Item
Copyright:©2003 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/46408
Official URL:http://dx.doi.org/10.1109/TEST.2003.1271107
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 214904