Towards Structural Testing of Superconductor Electronics


Joseph, Arun A. and Kerkhoff, Hans G. (2003) Towards Structural Testing of Superconductor Electronics. In: International Test Conference, ITC 2003, Sept. 30 - Oct. 2, 2003, Baltimore, USA (pp. pp. 1182-1191).

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Abstract:Many of the semiconductor technologies are already
facing limitations while new-generation data and
telecommunication systems are implemented. Although in
its infancy, superconductor electronics (SCE) is capable of
handling some of these high-end tasks. We have started a
defect-oriented test methodology for SCE, so that reliable
systems can be implemented in this technology. In this
paper, the details of the study on the Rapid Single-Flux
Quantum (RSFQ) process are presented. We present
common defects in the SCE processes and corresponding
test methodologies to detect them. The (measurement)
results prove that we are able to detect possible random
defects for statistical purposes in yield analysis. This
paper also presents possible test methodologies for RSFQ
circuits based on defect oriented testing (DOT).
Item Type:Conference or Workshop Item
Copyright:©2003 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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