Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores

Vermaak, H.J. and Kerkhoff, H.G. (2003) Enhanced P1500 Compliant Wrapper Suitable for Delay-Fault Testing of Embedded Cores. In: Eighth IEEE European Test Workshop, 2003, 25-28 May 2003, Maastricht, the Netherlands.

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Abstract:	Continual advances in the manufacturing processes of integrated circuits provide designers the ability to create more complex and denser architectures and increased functionality on a single chip. The increased usage of embedded cores necessitates a core-based test strategy in which cores are also tested separately. The IEEE P1500 proposed standard for embedded core test (SECT) is a standard under development which aims is to improve the testing of core-based system chips. This paper deals with the enhancement of the test wrapper and wrapper cells to provide a structure to be able to test embedded cores for delay faults. This approach allows delay fault testing of cores by using the digital oscillation test method and the help of the enhanced elements while staying compliant to the P1500 standard.
Item Type:	Conference or Workshop Item
Copyright:	©2003 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/46401
Official URL:	http://dx.doi.org/10.1109/ETW.2003.1231678
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