High resolution MFM: Simulation of tip sharpening


Saito, Hitoshi and Bos, Arnout van den and Abelmann, Leon and Lodder, J. Cock (2003) High resolution MFM: Simulation of tip sharpening. IEEE Transactions on Magnetics, 39 (5). pp. 3447-3449. ISSN 0018-9464

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Abstract:The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was estimated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan45/spl deg/. The sensitivity shows a maximum around an ellipticity of tan80/spl deg/. The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip.
Item Type:Article
Copyright:©2003 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/45378
Official URL:https://doi.org/10.1109/TMAG.2003.816178
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