Measurement of MOSFET LF Noise Under Large Signal RF Excitation


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Wel van der, Arnoud P. and Klumperink, Eric A.M. and Nauta, Bram (2002) Measurement of MOSFET LF Noise Under Large Signal RF Excitation. In: 32nd European Solid-State Device Research Conference, ESSDERC 2002, 24-26 September 2002, Firenze, Italy.

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Abstract:A new measurement technique is presented that allows measurement of MOSFET LF noise under large signal RF excitation. Measurements indicate that MOSFETS exhibit a reduction in LF noise when they are cycled from inversion to accummulation and that this reduction does not depend on the frequency of excitation for excitation frequencies of up to 3 GHz. The measurement results are significant because MOSFET LF noise is important in the design of RF CMOS circuits such as oscillators and mixers, where large signal swings occur. Additionally, the measurement results give new insights into the LF noise generating mechanisms in MOSFETs.
Item Type:Conference or Workshop Item
Copyright:©2002 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/43167
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