Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions


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Wel van der, A.P. and Klumperink, E.A.M. and Nauta, B. and Vandamme, L.K.J. and Gierkink, S.L.J. (2001) Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions. In: 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001, 22-25 October 2001, Gainesville, Florida.

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Copyright:© 2001 World Scientific
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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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