Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions

Wel van der, A.P. and Klumperink, E.A.M. and Nauta, B. and Vandamme, L.K.J. and Gierkink, S.L.J. (2001) Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions. In: 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001, 22-25 October 2001, Gainesville, Florida.

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Item Type:	Conference or Workshop Item
Copyright:	© 2001 World Scientific
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Circuit Design (ICD)
Link to this item:	http://purl.utwente.nl/publications/42857
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Metis ID: 204135