Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions
Wel, A.P. van der and Klumperink, E.A.M. and Nauta, B. (2001) Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions. In: ProRISC 2001, 12th Annual Workshop on Circuits, Systems and Signal Processing, 29-30 November 2001, Veldhoven, the Netherlands (pp. pp. 734-737).
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|Item Type:||Conference or Workshop Item|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/42571|
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