Simulation and Measurement of N-channel MOSFET RTS noise under Switched Bias conditions


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Wel, A.P. van der and Klumperink, E.A.M. and Nauta, B. (2001) Simulation and Measurement of N-channel MOSFET RTS noise under Switched Bias conditions. In: ProRISC 2001, 12th Annual Workshop on Circuits, Systems and Signal Processing, 29-30 November 2001, Veldhoven, the Netherlands (pp. pp. 734-737).

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Electrical Engineering, Mathematics and Computer Science (EEMCS)
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