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Testing of a Microanalysis System
Kerkhoff, Hans G. (2001) Testing of a Microanalysis System. IEEE Transactions on Instrumentation and Measurement, 50 (6). pp. 1050-1055. ISSN 0018-9456
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| Abstract: | During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment |
| Item Type: | Article |
| Copyright: | © 2001 IEEE |
| Faculty: | Electrical Engineering, Mathematics and Computer Science (EEMCS) |
| Research Group: | |
| Link to this item: | http://purl.utwente.nl/publications/42518 |
| Official URL: | http://dx.doi.org/10.1109/19.982932 |
| Export this item as: | BibTeX EndNote HTML Citation Reference Manager |
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