Testing of a Microanalysis System

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Kerkhoff, Hans G. (2001) Testing of a Microanalysis System. IEEE Transactions on Instrumentation and Measurement, 50 (6). pp. 1050-1055. ISSN 0018-9456

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Abstract:During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment
Item Type:Article
Copyright:© 2001 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/42518
Official URL:http://dx.doi.org/10.1109/19.982932
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Metis ID: 201748