Full scan testing of handshake circuits


Share/Save/Bookmark

Beest, F.J. te (2003) Full scan testing of handshake circuits. thesis.

open access
[img] PDF
1MB
Item Type:Thesis
Research Group:
Link to this item:http://purl.utwente.nl/publications/38651
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 211760