Editorial

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Hulst, Niek van (2001) Editorial. Journal of microscopy, 202 (1). p. 1. ISSN 0022-2720

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Abstract:This topical issue of the Journal of Microscopy contains all of the papers are based on work presented at NFO-6, the 6th International Conference on Near-field Optics and Related Techniques, held at the University of Twente, Enschede, the Netherlands, 27-31 August 2000.
Item Type:Article
Copyright:© 2001 Wiley
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Link to this item:http://purl.utwente.nl/publications/36820
Official URL:http://dx.doi.org/10.1046/j.1365-2818.2001.00906.x
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Metis ID: 203127