Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope
Hulst van, N.F. and Moers, M.H.P. and Noordman, O.F.J. and Faulkner, T. and Segerink, F.B. and Werf van der, K.O. and Grooth de, B.G. and Bölger, B. (1992) Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope. In: Scanning Probe Microscopies, January 20–22, 1992, Los Angeles, California, USA.
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|Abstract:||Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an inverted light microscope (LM) for preselection of a scan area. The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fiber probe, which is also presented. The combined microscope is operated either in open loop or as a force regulated SNOM. Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.
|Item Type:||Conference or Workshop Item|
|Copyright:||© 1992 SPIE|
|Link to this item:||http://purl.utwente.nl/publications/25736|
|Export this item as:||BibTeX|
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