Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation

Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1993) Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation. In: Scanning probe microscopies II, 18-19 January 1993, Los Angeles, California. International Society for Optical Engineering, Los Angeles, CA, U.S.A., pp. 202-208. ISBN 9780819410818

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Item Type:	Book Section
Research Group:	Optical Sciences (OS)
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Metis ID: 130529