Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation


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Putman, Constant A.J. and Werf, Kees O. van der and Grooth, Bart G. de and Hulst, Niek F. van and Greve, Jan (1993) Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation. In: Scanning probe microscopies II, 18-19 January 1993, Los Angeles, California. International Society for Optical Engineering, Los Angeles, CA, U.S.A., pp. 202-208. ISBN 9780819410818

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Additional information:Proceedings of SPIE-the International Society for Optical Engineering ; vol. 1855
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Link to this item:http://purl.utwente.nl/publications/25726
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Metis ID: 130529