Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation


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Putman, Constant A.J. and Werf van der, Kees O. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1993) Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation. In: Scanning probe microscopies II, 18-19 January 1993, Los Angeles, California. International Society for Optical Engineering, Los Angeles, CA, U.S.A., pp. 202-208. ISBN 9780819410818

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Metis ID: 130529