A new imaging mode in Atomic Force Microscopy based on the error signal


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Putman, C.A.J. and Werf van der, K.O. and Grooth de, B.G. and Hulst van, N.F. and Greve, J. and Hansma, P.K. (1992) A new imaging mode in Atomic Force Microscopy based on the error signal. In: 1639 SPIE Proceedings "Scanning Probe Microscopies", January 20–22, 1992, Los Angeles, California, USA.

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Copyright:© 1992 SPIE
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Link to this item:http://purl.utwente.nl/publications/25714
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