A new imaging mode in Atomic Force Microscopy based on the error signal

Putman, C.A.J. and Werf van der, K.O. and Grooth de, B.G. and Hulst van, N.F. and Greve, J. and Hansma, P.K. (1992) A new imaging mode in Atomic Force Microscopy based on the error signal. In: 1639 SPIE Proceedings "Scanning Probe Microscopies", January 20–22, 1992, Los Angeles, California, USA.

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Item Type:	Conference or Workshop Item
Copyright:	© 1992 SPIE
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25714
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