Micromolded Near-field optical probes

Brugger, J.P. and Kim, B.J. and Hulst van, N.F. (2000) Micromolded Near-field optical probes. In: 4th International Conference on the Development and Technological Application of Scanning Probe Methods, SXM4, 25-27 September 2000, Munster, Germany.

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Item Type:	Conference or Workshop Item
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25383
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