Applications of Near-field Optical & Atomic Force Microscopy

Hulst van, N.F. and Moers, M.H.P. and Ruiter, A.G.T. and Veerman, J.A. (1996) Applications of Near-field Optical & Atomic Force Microscopy. In: Eurosensors X, The 10th European Conference on Solid-State Transducers, September 8-11, 1996, Leuven, Belgium.

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Item Type:	Conference or Workshop Item
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25305
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