Applications of Near-field Optical & Atomic Force Microscopy


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Hulst van, N.F. and Moers, M.H.P. and Ruiter, A.G.T. and Veerman, J.A. (1996) Applications of Near-field Optical & Atomic Force Microscopy. In: Eurosensors X, The 10th European Conference on Solid-State Transducers, September 8-11, 1996, Leuven, Belgium.

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