Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

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Flueraru, C. and Dascula, D. and Osiceanu, P. and Hulst, N.F. van and Werf, K.O. van der and Putman, C.A.J. and Segerink, F.B. and Schipper, E.F. (1994) Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. In: 17th Annual Semiconductor Conference, 11-16 October, 1994, Sinaia, Romania (pp. pp. 679-700).

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