Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy
Flueraru, C. and Dascula, D. and Osiceanu, P. and Hulst, N.F. van and Werf, K.O. van der and Putman, C.A.J. and Segerink, F.B. and Schipper, E.F. (1994) Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. In: 17th Annual Semiconductor Conference, 11-16 October, 1994, Sinaia, Romania (pp. pp. 679-700).
Full text not available from this repository. The author is invited to upload the full text of this publication.
|Item Type:||Conference or Workshop Item|
|Link to this item:||http://purl.utwente.nl/publications/25291|
|Export this item as:||BibTeX|
Daily downloads in the past month
Monthly downloads in the past 12 months
Repository Staff Only: item control page
Metis ID: 130092