Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

Flueraru, C. and Dascula, D. and Osiceanu, P. and Hulst van, N.F. and Werf van der, K.O. and Putman, C.A.J. and Segerink, F.B. and Schipper, E.F. (1994) Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. In: 17th Annual Semiconductor Conference, 11-16 October, 1994, Sinaia, Romania.

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Item Type:	Conference or Workshop Item
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25291
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