Mapping optical field distributions in integrated waveguide structures using a stand-alone tunneling/atomic force microscope

Borgonjen, E.G. and Moers, M.H.P. and Ruiter, A.G.T. and Hulst van, N.F. (1995) Mapping optical field distributions in integrated waveguide structures using a stand-alone tunneling/atomic force microscope. In: EOS Topical Meeting on Near Field Optics, 1995, Brno, Czech Republic.

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Item Type:	Conference or Workshop Item
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25286
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