Mapping optical field distributions in integrated waveguide structures using a stand-alone tunneling/atomic force microscope

Share/Save/Bookmark

Borgonjen, E.G. and Moers, M.H.P. and Ruiter, A.G.T. and Hulst van, N.F. (1995) Mapping optical field distributions in integrated waveguide structures using a stand-alone tunneling/atomic force microscope. In: EOS Topical Meeting on Near Field Optics, 1995, Brno, Czech Republic.

Full text not available from this repository. The author is invited to upload the full text of this publication.

Item Type:Conference or Workshop Item
Research Group:
Link to this item:http://purl.utwente.nl/publications/25286
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 130087