Polarization contrast in photon scanning tunneling microscopy combined with atomic force microscopy

Propstra, K. and Hulst van, N.F. (1995) Polarization contrast in photon scanning tunneling microscopy combined with atomic force microscopy. In: EOS Topical Meeting on Near Field Optics, 1995, Brno, Czech Republic.

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Item Type:	Conference or Workshop Item
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/25285
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