Multi-detection and polarization contrast in scanning near field optical microscopy in reflection
Jalocha, A. and Moers, M.H.P. and Ruiter, A.G.T. and Hulst van, N.F. (1995) Multi-detection and polarization contrast in scanning near field optical microscopy in reflection. In: EOS Topical Meeting on Near Field Optics, 1995, Brno, Czech Republic.
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|Link to this item:||http://purl.utwente.nl/publications/25280|
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