Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes

Moers, M.H.P. and Tack, R.G. and Noordman, O.F.J. and Segerink, F.B. and Hulst van, N.F. and Bölger, B. (1993) Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. In: Near Field Optics. Kluwer Academic Publishers, Deventer, pp. 79-86. ISBN 9780792323945

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Research Group:	Optical Sciences (OS)
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