Investigation of the vicinal Ge(001) surface with STM


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Kersten, Bart A.G. and Sjerps-Koomen, Lianda and Zandvliet, Harold J.W. and Blank, Dave H.A. (1994) Investigation of the vicinal Ge(001) surface with STM. In: Determining nanoscale physical properties of materials by microscopy and spectroscopy. Materials Research Society Symposium Proceedings, 332 . Materials Research Society, Pittsburgh, MA, pp. 555-560. ISBN 9781558992313

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Abstract:The morphology of Ge(001) has been investigated with a UHV - Scanning tunneling Microscope. The ge(001) surface was misoriented towards the [011] direction with a miscut angle varying from 0.4 to 5. The surface stress was found to have considerable influence on the step edge configuration as well as the position of the steps with respect to each other.
Item Type:Book Section
Copyright:© 1994 Materials Research Society
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/25048
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Metis ID: 129849