Investigation of the vicinal Ge(001) surface with STM


Kersten, Bart A.G. and Sjerps-Koomen, Lianda and Zandvliet, Harold J.W. and Blank, Dave H.A. (1994) Investigation of the vicinal Ge(001) surface with STM. In: Mehmet Sarikaya & H. Kumar Wickramasinghe & Michael Isaacson (Eds.), Determining nanoscale physical properties of materials by microscopy and spectroscopy. Materials Research Society Symposium Proceedings, 332 . Materials Research Society, Pittsburgh, MA, pp. 555-560. ISBN 9781558992313

open access
Abstract:The morphology of Ge(001) has been investigated with a UHV - Scanning tunneling Microscope. The ge(001) surface was misoriented towards the [011] direction with a miscut angle varying from 0.4 to 5. The surface stress was found to have considerable influence on the step edge configuration as well as the position of the steps with respect to each other.
Item Type:Book Section
Copyright:© 1994 Materials Research Society
Science and Technology (TNW)
Research Group:
Link to this item:
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 129849