An Evanescent Field Optical Microscope


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Hulst, N.F. van and Segerink, F.B. and Bölger, B. (1991) An Evanescent Field Optical Microscope. In: Scanned Probe Microscopy, Santa Barbara CA 1991. American Institute of Physics, New York, NY, pp. 79-94. ISBN 9780883188163

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Abstract:An Evanescent Field Optical Microscope (EFOM) is presented, which employs frustrated total internal reflection on a highly localized scale by means of a sharp dielectric tip. The coupling of the evanescent field to the sub-micrometer probe as a function of probe-sample distance, angle of incidence and polarization has been characterized quantitatively both experimentally and theoretically. The coupling efficiency of light into the tip agrees with a description based on complex Fresnel coefficients. By scanning the tip images have been obtained of non-conducting dielectric samples, periodic gratings and non periodic structures, containing both topographic and dielectric information which clearly demonstrate the capacity of the evanescent field optical microscope for nanometer scale optical imaging. The effect of field gradient, tip-sample distance, polarization direction and tip artifacts on the images has been investigated. Recent results are presented.
Item Type:Book Section
Additional information:AIP Conference Proceedings 241 ; Scanned probe microscopy, Santa Barbara, California (USA), 6−11 Jan 1991
Copyright:© 1991 American Institute of Physics
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Link to this item:http://purl.utwente.nl/publications/24971
Official URL:http://dx.doi.org/10.1063/1.41406
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Metis ID: 129772