Tapping mode atomic force microscopy in liquid


Putman, Constant A.J. and Werf, Kees O. van der and Grooth, Bart G. de and Hulst, Niek F. van and Greve, Jan (1994) Tapping mode atomic force microscopy in liquid. Applied physics letters, 64 (18). pp. 2454-2456. ISSN 0003-6951

open access
PDF - Published Version
Abstract:We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. o­n soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not o­nly is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.
Item Type:Article
Copyright:© 1994 American Institute of Physics
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/24907
Official URL:https://doi.org/10.1063/1.111597
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 129708