Vacuum chamber for sample attachment in atomic force microscopy

Putman, Constant A.J. and Werf van der, Kees O. and Oort van, Geeske and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) Vacuum chamber for sample attachment in atomic force microscopy. Review of Scientific Instruments, 63 (8). pp. 4012-4013. ISSN 0034-6748

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Abstract:	A small ring-shaped vacuum chamber has been constructed and connected to the piezotube used for scanning samples in the atomic force microscope (AFM). Samples made up of any material, up to 50 mm in diameter, can be firmly attached onto the piezotube without causing damage to the sample. A 50-l beer container forms a buffer between vacuum pump and chamber. With this supply of vacuum, the AFM can be operated for a 4-8 h period without turning on the vacuum pump again. Samples can be changed within 30 s. The scan frequency when using microscope slides is limited to 40 Hz due to resonance effects of the microscope slides.
Item Type:	Article
Copyright:	© 1992 American Institute of Physics
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/24677
Official URL:	http://dx.doi.org/10.1063/1.1143258
Publisher URL:	http://link.aip.org/link/?RSINAK/63/4012/1
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Metis ID: 129478