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A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
Putman, Constant A.J. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) A detailed analysis of the optical beam deflection technique for use in atomic force microscopy. Journal of Applied Physics, 72 (1). pp. 6-12. ISSN 0021-8979
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| Item Type: | Article |
| Copyright: | © 1992 American Institute of Physics |
| Research Group: | |
| Link to this item: | http://purl.utwente.nl/publications/24674 |
| Official URL: | http://dx.doi.org/10.1063/1.352149 |
| Publisher URL: | http://link.aip.org/link/?JAPIAU/72/6/1 |
| Export this item as: | BibTeX EndNote HTML Citation Reference Manager |
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