Atomic force microscope featuring an integrated optical microscope

Putman, Constant A.J. and Grooth de, Bart G. and Hulst van, Niek F. and Greve, Jan (1992) Atomic force microscope featuring an integrated optical microscope. Ultramicroscopy, 42-44 (2). pp. 1549-1552. ISSN 0304-3991

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Abstract:	The atomic force microscope (AFM) is used to image the surface of both conductors and nonconductors. Biological specimens constitute a large group of nonconductors. A disadvantage of most AFM's is the fact that relatively large areas of the sample surface have to be scanned to pinpoint a biological specimen (e.g. cell, chromosome) of interest. The AFM presented here features an incorporated optical microscope. Using an XY- stage to move the sample, an object is selected with the aid of the optical microscope and a high-resolution image of the object can be obtained using the AFM. Results on chromosomes and cells demonstrate the potential of this instrument. The microscope further enables a direct comparison between optically observed features and topological information obtained from AFM images.
Item Type:	Article
Copyright:	© 1992 Elsevier Science
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/24642
Official URL:	http://dx.doi.org/10.1016/0304-3991(92)90481-X
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