Atomic force microscope featuring an integrated optical microscope

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Putman, Constant A.J. and Grooth, Bart G. de and Hulst, Niek F. van and Greve, Jan (1992) Atomic force microscope featuring an integrated optical microscope. Ultramicroscopy, 42-44 (2). pp. 1549-1552. ISSN 0304-3991

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Abstract:The atomic force microscope (AFM) is used to image the surface of both conductors and nonconductors. Biological specimens constitute a large group of nonconductors. A disadvantage of most AFM's is the fact that relatively large areas of the sample surface have to be scanned to pinpoint a biological specimen (e.g. cell, chromosome) of interest. The AFM presented here features an incorporated optical microscope. Using an XY- stage to move the sample, an object is selected with the aid of the optical microscope and a high-resolution image of the object can be obtained using the AFM. Results o­n chromosomes and cells demonstrate the potential of this instrument. The microscope further enables a direct comparison between optically observed features and topological information obtained from AFM images.
Item Type:Article
Copyright:© 1992 Elsevier Science
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Link to this item:http://purl.utwente.nl/publications/24642
Official URL:http://dx.doi.org/10.1016/0304-3991(92)90481-X
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Metis ID: 129443