A combined near field optical and force microscope

Moers, M.H.P. and Tack, R.G. and Hulst van, N.F. and Bölger, B. (1993) A combined near field optical and force microscope. Scanning Microscopy, 7 (3). pp. 789-792. ISSN 0891-7035

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Abstract:	Scanning near field optical microscopy (SNOM) is the optical alternative of the scanning probe microscopical techniques which enables a lateral resolution down to about 10 nm, unlimited by diffraction. Moreover, the potential of non- destructive imaging of chemical and biological samples with nanometer resolution in ambient conditions is a crucial advantage over electron microscopy. An integrated microscope has been constructed which allows simultaneous detection of optical and force interaction between a microfabricated SiN probe and a sample surface. Images are obtained in a transmission mode by detection of the light emanating from a 'super-tip' in contact with the sample surface and illuminated by total internal reflection. Physical and technical aspects of the instrument are discussed and illustrated with typical images.
Item Type:	Article
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/24631
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