Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves

Hulst van, N.F. and Segerink, F.B. and Achten, F. and Bölger, B. (1992) Evanescent-field optical microscopy: effects of polarization, tip shape and radiative waves. Ultramicroscopy, 42-44 (1). pp. 416-421. ISSN 0304-3991

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Abstract:	Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.
Item Type:	Article
Copyright:	© 1992 Elsevier Science
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/24578
Official URL:	http://dx.doi.org/10.1016/0304-3991(92)90301-Y
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Metis ID: 129379