Photon scanning tunneling microscope in combination with a force microscope

Moers, M.H.P. and Tack, R.G. and Hulst van, N.F. and Bölger, B. (1994) Photon scanning tunneling microscope in combination with a force microscope. Journal of Applied Physics, 75 (3). pp. 1254-1257. ISSN 0021-8979

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Abstract:	The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir-Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit
Item Type:	Article
Copyright:	© 1994 American Institute of Physics
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/24575
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