Study of the leakage field of magnetic force microscopy thin-film tips using electron holography

Frost, B.G. and Hulst van, N.F. and Lunedei, E. and Matteucci, G. and Rikkers, E. (1996) Study of the leakage field of magnetic force microscopy thin-film tips using electron holography. Applied Physics Letters, 68 (13). pp. 1865-1867. ISSN 0003-6951

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Abstract:	Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area.
Item Type:	Article
Copyright:	© 1996 American Institute of Physics
Research Group:	Optical Sciences (OS) Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/24558
Official URL:	http://dx.doi.org/10.1063/1.116039
Publisher URL:	http://link.aip.org/link/?APPLAB/68/1865/1
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