Polarization contrast in fluorescence scanning near-field optical microscopy in reflection

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Jalocha, A. and Hulst, N.F. van (1995) Polarization contrast in fluorescence scanning near-field optical microscopy in reflection. Journal of the Optical Society of America B: Optical Physics, B12 (9). pp. 1577-1580. ISSN 0740-3224

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Abstract:Polarization contrast is presented in fluorescence images of a Langmuir-Blodgett monolayer obtained with a scanning near-field optical microscope operated in reflection. A tapered optical fiber is used both to excite and to collect the fluorescence. The lateral resolution in the reflection fluorescence image is estimated at 200 nm. Shear-force detection controls the tip-to- surface distance and simultaneously gives a topographic map. Direct correlation between topography and the fluorescent domain is thus obtained. We show that the fluorescence is polarized along the molecular orientation in the Langmuir- Blodgett monolayer. Thus we demonstrate the study of the polarization direction in the reflection mode.
Item Type:Article
Copyright:© 1995 Optical Society of America
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Link to this item:http://purl.utwente.nl/publications/24551
Official URL:http://dx.doi.org/10.1364/JOSAB.12.001577
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