Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer

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Blank, D.H.A. and Aarnink, W.A.M. and Flokstra, J. and Rogalla, H. and Silfhout van, A. (1990) Physical properties and interface studies of YBa2Cu3O7 thin films deposited by laser ablation on S1 (111) with buffer layer. Journal of the Less-Common Metals, 164-16 (Part 2). pp. 1178-1185. ISSN 0022-5088

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Abstract:The physical properties of laser-deposited YBaCuO on Si using a single buffer layer of ZrO2 and a double layer of NiSi2 and ZrO2 have been studied. The influence of the deposition temperature has been investigated. Interface studies were performed by RBS and SAM. SEM pictures, resistivity and critical current measurements complete this study. The granularity of the films is very important for the diffusion of the Si.
Item Type:Article
Copyright:© 1990 Elsevier Science
Faculty:
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/24335
Official URL:http://dx.doi.org/10.1016/0022-5088(90)90534-Q
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Metis ID: 129135