Microstructure and magnetic properties of very thin CoCr films deposited on different underlayers by RF-sputtering

Pan, G. and Mapps, D.J. and Akhter, M.A. and Lodder, J.C. and Berge ten, P. and Wong, H.Y. and Chapmann, J.N. (1992) Microstructure and magnetic properties of very thin CoCr films deposited on different underlayers by RF-sputtering. Journal of Magnetism and Magnetic Materials, 113 (1-3). pp. 21-28. ISSN 0304-8853

Preview

PDF
1814Kb

Abstract:	Very thin CoCr films deposited on different underlayers on glass disk substrates were studied by the magneto-optic Kerr effect, VSM, torque magnetometry and TEM selected area diffraction. Square or near square perpendicular loops were obtained from Co/Ti, CoCr/Au, CoCr/Al, CoCr/C and CoCr/Si films. TEM SAD study revealed that the crystalline structure is a key factor determining the magnetic anisotropy of the very thin CoCr films. In particular, the c-axis of the hep CoCr films which exhibit square perpendicular loops is perpendicular to the film plane whilst that of the CoCr films which exhibit a thin and flat perpendicular loop lies in the film plane. The texture of the very thin CoCr films deposited on different underlayers is mainly dependent on the structure and texture of underlayers. The relation between the structure of CoCr and its underlayers is discussed.
Item Type:	Article
Copyright:	© 1992 Elsevier Science
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST)
Link to this item:	http://purl.utwente.nl/publications/24288
Official URL:	http://dx.doi.org/10.1016/0304-8853(92)91242-L
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 129088