Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films

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Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout, A. van (1992) Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films. Applied Surface Science, 55 (2-3). pp. 117-133. ISSN 0169-4332

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Copyright:© 1992 Elsevier Science
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Link to this item:http://purl.utwente.nl/publications/24249
Official URL:http://dx.doi.org/10.1016/0169-4332(92)90101-3
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Metis ID: 129049