Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films
Aarnink, W.A.M. and Gao, J. and Rogalla, H. and Silfhout van, A. (1992) Quantitative analysis of X-ray photo emission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7-delta thin films. Applied Surface Science, 55 (2-3). pp. 117-133. ISSN 0169-4332
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| Item Type: | Article |
| Copyright: | © 1992 Elsevier Science |
| Faculty: | Science and Technology (TNW) |
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| Link to this item: | http://purl.utwente.nl/publications/24249 |
| Official URL: | http://dx.doi.org/10.1016/0169-4332(92)90101-3 |
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