Full microscopic treatment of the optical response of the Si(100)2x1 surface

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Wijers, C.M.J. and Poppe, G.P.M. and Boeij de, P.L. and Bekker, H.G. and Wentink, D.J. (1993) Full microscopic treatment of the optical response of the Si(100)2x1 surface. Thin Solid Films, 233 (1-2). pp. 28-31. ISSN 0040-6090

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Abstract:The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).
Item Type:Article
Copyright:© 1993 Elsevier Science
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Link to this item:http://purl.utwente.nl/publications/24106
Official URL:http://dx.doi.org/10.1016/0040-6090(93)90055-T
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