Full microscopic treatment of the optical response of the Si(100)2x1 surface

Wijers, C.M.J. and Poppe, G.P.M. and Boeij de, P.L. and Bekker, H.G. and Wentink, D.J. (1993) Full microscopic treatment of the optical response of the Si(100)2x1 surface. Thin Solid Films, 233 (1-2). pp. 28-31. ISSN 0040-6090

Preview

PDF
358Kb

Abstract:	The optical reflection from the Si(100) 2 × 1 surface has been calculated, using the discrete dipole model and local polarizabilities obtained from quantum mechanical cluster calculations. Results have been compared with experimental differential reflectance (Si) and optical anisotropy measurements (Ge).
Item Type:	Article
Copyright:	© 1993 Elsevier Science
Research Group:	Solid State Physics (VSF)
Link to this item:	http://purl.utwente.nl/publications/24106
Official URL:	http://dx.doi.org/10.1016/0040-6090(93)90055-T
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Repository Staff Only: item control page

Metis ID: 128905