Ion-implantation induced anomalous surface amorphization in silicon

Lohner, T. and Kotai, E. and Khanh, N.Q. and Toth, L. and Fried, M. and Vedam, K. and Nguyen, N.V. and Hanekamp, L.J. and Silfhout van, A. (1994) Ion-implantation induced anomalous surface amorphization in silicon. Nuclear Instruments and Methods in Physics Research. Section B: Beam interactions with materials and atoms, 85 (1-4). pp. 335-339. ISSN 0168-583X

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Abstract:	Spectroscopic ellipsometry (SE), high-depth-resolution Rutherford backscattering (RBS) and channeling have been used to examine the surface damage formed by room temperature N and B implantation into silicon. For the analysis of the SE data we used the conventional method of assuming appropriate optical models and fitting the model parameters (layer thicknesses and volume fraction of the amorphous silicon component in the layers) by linear regression. The dependence of the thickness of the surface-damaged silicon layer (beneath the native oxide layer) on the implantation parameters was determined: the higher the dose, the thicker the disordered layer at the surface. The mechanism of the surface amorphization process is explained in relation to the ion beam induced layer-by-layer amorphization. The results demonstrate the applicability of Spectroscopic ellipsometry with a proper optical model. RBS, as an independent cross-checking method supported the constructed optical model.
Item Type:	Article
Copyright:	© 1994 Elsevier Science
Research Group:	Solid State Physics (VSF)
Link to this item:	http://purl.utwente.nl/publications/24091
Official URL:	http://dx.doi.org/10.1016/0168-583X(94)95839-4
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