In-situ monitoring during PLD of YBa2Cu3O7- using RHEED at high oxygen pressure

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Rijnders, Guus J.H.M. and Koster, Gertjan and Blank, Dave H.A. and Rogalla, Horst (1999) In-situ monitoring during PLD of YBa2Cu3O7- using RHEED at high oxygen pressure. IEEE Transactions on Applied Superconductivity, 9 (2, Par). pp. 1547-1550. ISSN 1051-8223

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Abstract:The surface morphology and initial growth of YBa2Cu3Ou-, using Pulsed Laser Deposition (PLD), have been subject to in many studies. Both, Scanning Probe Microscopy (SPM) as well as Reflection High Energy Electron Diffraction (RHEED) have been applied. The latter is mostly operated using modified deposition parameters, like a reduced oxygen pressure. Here, we have studied the initial growth using a PLD-RHEED system at standard PLD pressures. In this system, in-situ RHEED can be applied in a background pressure of oxygen up to 50 Pa. The initial growth of YBa 2Cu3O7- on SrTiO3 substrates is studied. The influence of the substrate termination, i.e., SrO or TiO2, on the growth will be discussed
Item Type:Article
Copyright:© 1999 IEEE
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/24014
Official URL:http://dx.doi.org/10.1109/77.784689
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