Photon scanning tunneling microscopy of tailor-made photonic structures

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Peeters, C. and Flück, E. and Otter, A.M. and Balistreri, M.L.M. and Korterik, J.P. and Kuipers, L. and Hulst van, N.F. (2000) Photon scanning tunneling microscopy of tailor-made photonic structures. Applied Physics Letters, 77 (1). pp. 142-144. ISSN 0003-6951

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Abstract:Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs
Item Type:Article
Copyright:© 2000 American Institute of Physics
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Link to this item:http://purl.utwente.nl/publications/23830
Official URL:http://dx.doi.org/10.1063/1.126903
Publisher URL:http://link.aip.org/link/?APPLAB/77/142/1
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