Photon scanning tunneling microscopy of tailor-made photonic structures

Peeters, C. and Flück, E. and Otter, A.M. and Balistreri, M.L.M. and Korterik, J.P. and Kuipers, L. and Hulst van, N.F. (2000) Photon scanning tunneling microscopy of tailor-made photonic structures. Applied Physics Letters, 77 (1). pp. 142-144. ISSN 0003-6951

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Abstract:	Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs
Item Type:	Article
Copyright:	© 2000 American Institute of Physics
Research Group:	Optical Sciences (OS)
Link to this item:	http://purl.utwente.nl/publications/23830
Official URL:	http://dx.doi.org/10.1063/1.126903
Publisher URL:	http://link.aip.org/link/?APPLAB/77/142/1
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