Atomic Steps with tuning-fork-based noncontact atomic force microscopy

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Rensen, W.H.J. and Hulst van, N.F. and Ruiter, A.G.T. and West, P.E. (1999) Atomic Steps with tuning-fork-based noncontact atomic force microscopy. Applied Physics Letters, 75 (11). pp. 1640-1642. ISSN 0003-6951

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Abstract:Tuning forks as tip-sample distance detectors are a promising and versatile alternative to conventional cantilevers with optical beam deflection in noncontact atomic force microscopy (AFM). Both theory and experiments are presented to make a comparison between conventional and tuning-fork-based AFM. Measurements made o­n a Si(111) sample show that both techniques are capable of detecting monatomic steps. The measured step height of 0.33 nm is in agreement with the accepted value of 0.314 nm. According to a simple model, interaction forces of 30 pN are obtained for the tuning-fork-based setup, indicating that, at the proper experimental conditions, the sensitivity of such an instrument is competitive to conventional lever-based AFM.
Item Type:Article
Copyright:© 1999 American Institute of Physics
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Link to this item:http://purl.utwente.nl/publications/23819
Official URL:http://dx.doi.org/10.1063/1.124780
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