TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals

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Traeholt, C. and Wen, J.G. and Zandbergen, H.W. and Shen, Y. and Hilgenkamp, H. (1994) TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals. Physica C: Superconductivity, 230 (3-4). pp. 425-434. ISSN 0921-4534

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Abstract:YBa2Cu3O7 films in c-axis orientation on bicrystalline SrTiO3 substrates are investigated by TEM. The films and the substrates are examined in cross-section and in plane view. The grain boundary of the bicrystal substrate contains (110) faceted voids, but is otherwise straight on a nanometer scale. Contrary to this, the film grain boundary is not straight grain boundary can be up to 100 nm for a 100 nm thick film. The deviation from the intended position of the YBCO grain boundary can already occur at the film/substrate interface where it can be as much as ±50 nm.
Item Type:Article
Copyright:© 1994 Elsevier Science
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/23777
Official URL:http://dx.doi.org/10.1016/0921-4534(94)90861-3
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Metis ID: 128576