TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals


Traeholt, C. and Wen, J.G. and Zandbergen, H.W. and Shen, Y. and Hilgenkamp, H. (1994) TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals. Physica C: Superconductivity, 230 (3-4). pp. 425-434. ISSN 0921-4534

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Abstract:YBa2Cu3O7 films in c-axis orientation on bicrystalline SrTiO3 substrates are investigated by TEM. The films and the substrates are examined in cross-section and in plane view. The grain boundary of the bicrystal substrate contains (110) faceted voids, but is otherwise straight on a nanometer scale. Contrary to this, the film grain boundary is not straight grain boundary can be up to 100 nm for a 100 nm thick film. The deviation from the intended position of the YBCO grain boundary can already occur at the film/substrate interface where it can be as much as ±50 nm.
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Copyright:© 1994 Elsevier Science
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/23777
Official URL:https://doi.org/10.1016/0921-4534(94)90861-3
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