Proximity effect Nb/Al,AlOxide, Al/Nb Josephson tunnel junctions

Share/Save/Bookmark

Houwman, E.P. and Gijsbertsen, J.G. and Flokstra, J. and Rogalla, H. and Grand, J.B. le and Korte, P.A.J. de and Golubov, A.A. (1993) Proximity effect Nb/Al,AlOxide, Al/Nb Josephson tunnel junctions. IEEE Transactions on Applied Superconductivity, 3 (1, Par). pp. 2170-2171. ISSN 1051-8223

open access
[img]
Preview
PDF
646kB
Abstract:Regions with reduced energy gap induced by the proximity effect give rise to quasi-particle loss in Josephson-junction X-ray detectors, but may also be used advantageously for quasi-particle collection. The influence of the thickness of the Al proximity layers in Nb/Al1 , AlOx, Al2/Nb Josephson tunnel junctions on the electrical characteristics has been investigated theoretically and experimentally. Theoretically it is found that the strength of the proximity effect is mainly determined by the proximity effect is mainly determined by the proximity parameters γM1 (γM2) of the electrodes. Good fits of the measured I-V curves with theory were obtained for junctions with thicknesses dA11 ranging from 4 to 25 nm and dA12=3 nm, with γM2≈0.12 and γM1/γM2=dA11/d A12. For all junctions the proximity knee remains more pronounced than predicted.
Item Type:Article
Copyright:© 1993 IEEE
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/23724
Official URL:http://dx.doi.org/10.1109/77.233933
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 128523