The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

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Haken, B. ten and Klundert, L.J.M. van de and Vysotski, V.S. and Karasik, V.R. (1992) The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field. IEEE Transactions on Magnetics, 28 (1). pp. 755-758. ISSN 0018-9464

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Abstract:With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-¿m-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape
Item Type:Article
Copyright:©1992 IEEE
Faculty:
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/23716
Official URL:http://dx.doi.org/10.1109/20.119989
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