Atomic force microscopic studies on the growth of self-assembled monolayer on SrTiO3 surfaces

Share/Save/Bookmark

Kropman, Boike L. and Blank, Dave H.A. and Rogalla, Horst (1998) Atomic force microscopic studies on the growth of self-assembled monolayer on SrTiO3 surfaces. Thin Solid Films, 327 (1). pp. 185-190. ISSN 0040-6090

[img] PDF
Restricted to UT campus only
: Request a copy
106kB
Abstract:The growth mechanism of octadecyltrichlorosilane (OTS) on SrTiO3 substrates has been investigated by wettability and force microscopy measurements. The films were formed by the self-assembly technique. It was found that growth proceeded via two types of islands: large `fractal-like' islands and smaller circular patches of molecules. The patches grow by attachment of monomers and coalescence with other islands. The overall growth mode obeyed first order Langmuir kinetics and is found to be similar to the growth of alkylsiloxanes on SiO2 and mica. The difference between growth on SrTiO3 and SrTiO3:Nb is that the growth rate is slower on the latter substrate.
Item Type:Article
Copyright:© 1998 Elsevier Science
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/23570
Official URL:http://dx.doi.org/10.1016/S0040-6090(98)00625-7
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 128369